InfraScope® MWIR Temperature Mapping Microscope

The InfraScopeTM 2D MWIR Temperature Mapping Microscopy solution, from Quantum Focus Instruments Corporation (QFI), has been used to verify thermal design rules, verify die and solder attachment, localize reliability issues and optimize thermal packages. Given that the wavelengths involved are infrared, the custom microscope objectives are made with infrared transmissive materials such as silicon, germanium, sapphire and zinc selenide.

Configuration

  • Most of the contrast in an unprocessed infrared image of a circuit is not due to temperature. Rather, in an unprocessed image, differences in emissivity create the most contrast. Emissivity is a material property that influences how efficiently the material emits photons.
  • QFI uses patented algorithms and proprietary software to measure and compensate for the emissivity of the material being tested in order to generate an accurate, calibrated temperature map image. Pixel-by-pixel emissivity measurement and compensation has been practiced on QFI systems for many years. QFI’s solution is rapid, accurate and automatic.
  • 5X and 20 x infrared objectives
  • Thermal Imaging mapping (512 x 512 pixels) by MWIR camera InSB
  • Transient measurements using a single diode InSb up to microsecond