Secondary ion mass spectrometry M6

Advanced Ion Beam Technology for Surface Analysis

The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. New ground-breaking ion beam and mass analyser technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research.

To be delivered shortly

Configuration

  • High lateral resolution (< 50 nm) with the new Nanoprobe 50
  • Mass resolution > 30,000
  • Unique delayed extraction mode for high transmission with high lateral and high mass resolution simultaneously
  • Unmatched dynamic range and detection limits
  • TOF MS/MS with CID fragmentation for molecular structure elucidation
  • New flexible, push-button, closed-loop sample heating and cooling system for long-term operation without user interaction
  • Sophisticated SurfaceLab 7 software including fully integrated Multivariate Statistical Analysis (MVSA) software package