The THB Evaluation System is a reliability test system that applies voltage at high temperature and humidity to allow automotive semiconductors, etc. to achieve high reliability under rigorous conditions compared to consumer semiconductors.
The features of the chamber support various types of devices while allowing heat generation of devices in high temperature and humidity environments.
It provides custom support for static burn-in, dynamic burn-in, and monitor burn-in, according to your needs, and it offers the optimal system to meet your temperature and humidity range and test quantity demands.
