X-ray diffraction

The Rigaku SmartLab® is the newest high-resolution X-ray diffractometer (HR-XRD) available today.

This system has been customised to explore in-operando conditions of materials and devices for the simultaneous investigation of:

  • structural properties
  • electrical behaviour
  • optical response

Configuration

Simultaneous analyses:

  • X-ray Diffraction
  • X-ray Reflectivity
  • Current-Voltage curves
  • MPP Tracking
  • EIS curves
  • Photoluminescence

To study:

  • Light soaking
  • Sun-Bias-Lattice effects
  • Device Ageing
  • UV Ageing
  • Reverse Bias Ageing
  • Temperature Ageing
  • Humidity and N2 effects
  • Phase purity
  • Phase transitions
  • Strain effects
  • X-ray detection