Beyondnano Sub Å Lab

S/TEM - JEOL ARM200F - probe corrected

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TEM - JEOL JEM 2010F

FIB - Helios 5 UC “triple” Beam for Materials Science

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SEM - JEOL JSM-IT800

Ultramicrotomo cryo - Leica EM UC7

Allied MultiPrep® System

Optical microscope - Zeiss imager.Z2m

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